Detail Metal Hardness Tester PCE-900
Metal Hardness Tester PCE-900
Instrument Laboratorium
Deskripsi produk
DESCRIPTION
PCE-900 Material hardness tester for metals
9 materials pre-calibrated / Conversion into 6 different hardness scales / Type D impact probe
The Leeb Hardness Tester PCE-900 measures the hardness of nine different metals using the Leeb rebound method. This means that with the hardness tester a firing pin bounces on a metallic surface and the intensity of the rebound is used as an indicator of the material hardness. The hardness tester PCE-900 measures the metal hardness in 6 different hardness scales, including: Rockwell, Vickers, Leeb, Brinell and Shore. A distinction is made between Rockwell B and C when measuring in the Rockwell scale.
The Leeb hardness tester PCE-900 comes with a type D impact probe as standard. This probe can be used for many measurements. Via the optional software, the measured values can be transmitted live to the PC. This makes the PCE-900 Leeb hardness tester an important instrument in the field of material inspection in goods control.
HIGHLIGHTS
- Hardness test by the rebound method
- 9 material presets
- Easy to handle
- Data interface
- Six different hardness scales
SPECIFICATION
Measuring range
200 ... 900 HL
Measuring accuracy
± 0.8% at HLD=900
Materials
9 common material presets
Hardness scales
Leeb: HL
Rockwell C: HRC
Rockwell B: HRB
Brinell: HB
Vickers: HV
Shore: HSD
Display
12.5 mm / 0.5" LCD with backlight
Impact probe
Type D
Memory
50 data sets
Interface
RS-232
Power supply
4 x 1.5V AAA batteries
Environmental conditions
Operating temperature: -10 ... 50°C / 14 ... 122°F
Storage temperature: -30 ... 60°C / -22 ... 140°F
Relative humidity: < 90%
Dimensions
142 x 77 x 40 mm / 5.59 x 3.03 x 1.58 in
Weight
Device weight: ca. 130 g / < 1 lb
Probe weight: 75 g / < 1 lb
Cable length
ca. 1.2 m / 3.9 ft
DELIVERY SCOPE
1 x Material Hardness Tester for Metal PCE-900
1 x Impact probe Type D
1 x Test block
1 x Support ring
1 x Cleaning brush
1 x Carrying case
1 x User manual
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